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Fraunhofer IISB and Park Systems are announcing the call for abstracts as well as opening registration for the 2nd International Symposium on Failure Analysis and Material Testing – FAMT 2022. This symposium gathers the professionals from the electronic industry to discuss Weiterlesen
NSFE series is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM). The research focus of the 5th NSFE 2022 will be laid on Weiterlesen
Advancing miniaturization shapes our modern, high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet Weiterlesen
NanoScientific Forum Europe (NSFE) series is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM). The third NanoScientific Forum Europe (#NSFE2020) will focus Weiterlesen